一种用于穿刺定位的双平面探头制造技术

技术编号:6085383 阅读:430 留言:0更新日期:2012-04-11 18:40
一种用于穿刺定位的双平面探头,包括穿刺针、第一探测面、第二探测面、探头头端、第一探测台、第二探测台,其特征在于第一探测面位于第一探测台上,第二探测面位于第二探测台上,第一探测台位于探头头端的前端,第二探测台位于探头头端中部,穿刺针位于第二探测台上,第一探测面、第二探测面和穿刺针的探测信号及控制信号传输通道位于探头头端内。第二探测面与第一探测面在探头头端曲面上垂直。操作中,通过第一探测面和第二探测面分别从两个方向进行超声波探测,结合超声图象进行定位,然后穿刺针伸出进行穿刺操作。使用这种探头可进行精准定位,且不易窜位。

A biplane probe for puncture positioning

For a dual plane probe puncture, puncture needle, including the first and second detection surface detection surface, the probe head end, the first detection of Taiwan, Second Taiwan detection, characterized in that the first face detection in the first detection stage, second probe detection surface is located in the second stage, the first probe station is located in front of the probe head end second, Taiwan is located in the central head end detection probe, the puncture needle is located in second probe station, the detection signal and control signal transmission channel of the first and second detection surface detection surface and the puncture needle is located in the head end of the probe. The second detecting surface is perpendicular to the first detecting surface on the head end surface of the probe. During operation, ultrasound probes are conducted in two directions from the first detecting surface and the second detecting surface, and the ultrasonic image is positioned in combination with the ultrasonic needle, and then the needle extends out to perform the puncture operation. The probe can be used for precise positioning and not easy to escape.

【技术实现步骤摘要】

【技术保护点】
一种用于穿刺定位的双平面探头,包括穿刺针、第一探测面、第二探测面、探头头端、第一探测台、第二探测台,其特征在于第一探测面位于第一探测台上,第二探测面位于第二探测台上,第一探测台位于探头头端的前端,第二探测台位于探头头端中部,穿刺针位于第二探测台上,第一探测面、第二探测面和穿刺针的探测信号及控制信号传输通道位于探头头端内。

【技术特征摘要】

【专利技术属性】
技术研发人员:周正帮沈忠
申请(专利权)人:苏州中加医疗科技有限公司
类型:发明
国别省市:32

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