The invention relates to a COC aging and testing carrier, including a COC body and a clamp for providing a mechanical support for the COC body. Fixed holes are arranged on the base plate and are detachably arranged on the feeding table through screws matching with the fixed holes. A cavity for accommodating the COC body is arranged on the other end of the base plate. The other side of the cavity is provided with a rotatable connecting pogo pin mounting seat, and the pogo pin mounting seat is provided with a mounting hole corresponding to the fixed hole. A connecting PCB board is also provided between the pogo pin mounting seat and the golden finger connecting plate, and the connecting PCB board is electrically connected with the pogo pin and the golden finger connecting plate respectively. A heating film, a high-temperature fuse and a thermistor are also arranged in the base plate; the invention is suitable for the aging of COC products in the process of screening and testing fixture and loading scheme, through the precise coordination of various parts of the fixture, COC positioning and charging can be realized accurately and reliably, and the fixture itself can be heated without external heat sources. The material is convenient and quick.
【技术实现步骤摘要】
一种COC老化与测试夹具
本专利技术涉及光通信行业领域,尤其涉及一种COC老化与测试夹具。
技术介绍
随着光通讯行业的迅猛发展,激光器芯片厂家对芯片的集成度做的越来越高。TOSA(TransmitterOpticalSubassembly,光发射次模块)常见的封装形式有两种:TO封装和BOX(壳体)封装。TO封装的缺点是目前可以做到的速率不高,所以对于一些高速率器件还是需要选择BOX封装。BOX封装,也称深腔封装,无论从传输速率还是散热等方面都要优于TO封装,但由于贴装是在一个空间很小的壳体内完成,其贴装难度和成本远大于TO封装。如何在封装前就将不良的COC(ChipOnCarrier)筛选出来,就成为了COC生产厂家需要解决的重大问题。高温功率老化是行业内采用的比较多的筛选方法,高温功率老化是给元器件通电,模拟器件在实际电路中的工作条件,再加上+80~+150℃之间的高温进行几小时至几十小时的老化,使它们内部潜在的故障加速暴露出来,然后进行电气参数测量,筛选剔除那些失效或参数变化了元器件,尽可能把早期失效消灭在之前。由于COC的尺寸很小,只能通过上表面裸露的很小 ...
【技术保护点】
1.一种COC老化与测试载体,其特征在于,包括COC本体和为COC本体提供机械支撑的夹具,所述夹具包括底座基板、pogo pin安装座、转接PCB板和设置在底座基板侧端的金手指连接板,所述底座基板上设置有固定孔并通过与固定孔相配合的螺丝可拆卸设置在上料台上,所述底座基板上的另一侧端设置有用于容纳COC本体的空腔,所述空腔的一侧显露在底座基板外侧并连接设置有上料台槽位,所述空腔的另一侧设置可转动连接有pogo pin安装座,所述pogo pin安装座上设置有与固定孔相对应的安装孔,所述pogo pin安装座外端安装设置有用于将电信号引出的pogo pin,所述pogo pin ...
【技术特征摘要】
1.一种COC老化与测试载体,其特征在于,包括COC本体和为COC本体提供机械支撑的夹具,所述夹具包括底座基板、pogopin安装座、转接PCB板和设置在底座基板侧端的金手指连接板,所述底座基板上设置有固定孔并通过与固定孔相配合的螺丝可拆卸设置在上料台上,所述底座基板上的另一侧端设置有用于容纳COC本体的空腔,所述空腔的一侧显露在底座基板外侧并连接设置有上料台槽位,所述空腔的另一侧设置可转动连接有pogopin安装座,所述pogopin安装座上设置有与固定孔相对应的安装孔,所述pogopin安装座外端安装设置有用于将电信号引出的pogopin,所述pogopin安装座与金手指连接板之间还设置有转接PCB板,所述转接PCB板分别与pogopin、金手指连接板电性连接,所述底座基板内还设置有加热膜、...
【专利技术属性】
技术研发人员:唐朋,
申请(专利权)人:武汉普赛斯电子技术有限公司,
类型:发明
国别省市:湖北,42
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