CT系统参数确定方法及装置制造方法及图纸

技术编号:22568729 阅读:35 留言:0更新日期:2019-11-16 13:40
一种CT系统参数确定方法及装置(1,140),涉及计算机成像技术领域,包括:控制具有互相垂直的第一平面(A1)和第二平面(B1)的模体(M),在X射线源(01)和探测器(02)的探测面(Y)之间移动,并获取模体(M)在移动过程中在探测面(Y)上的X射线投影(301),其中,在模体(M)移动的过程中,第一平面(A1)和第二平面(B1)始终垂直于探测面(Y);根据获取到的X射线投影确定第一直线(Lu)和第二直线(Lv)(302);将第一直线(Lu)与第二直线(Lv)的交点(O')确定为X射线源(01)的焦点(S)在探测面(Y)上的垂足坐标(303),CT系统参数包括垂足坐标。方法解决了模体(M)的制造工艺较复杂的问题,简化了模体(M)的制造工艺,用于确定CT系统参数。

Determination method and device of CT system parameters

A method and device for determining CT system parameters (1140) relates to the technical field of computer imaging, including: controlling a module (m) with a first plane (A1) and a second plane (B1) perpendicular to each other, moving between the detection plane (y) of the X-ray source (01) and the detector (02), and acquiring the X-ray projection (301) of the module (m) on the detection plane (y) during the moving process, wherein the module (m) moves too much In the process, the first plane (A1) and the second plane (B1) are always perpendicular to the detection surface (y); the first straight line (Lu) and the second straight line (LV) (302) are determined according to the obtained X-ray projection; the intersection point (o ') of the first straight line (Lu) and the second straight line (LV) is determined as the perpendicular coordinate (303) of the focus (s) of the X-ray source (01) on the detection surface (y), and the CT system parameters include the perpendicular coordinate. The method solves the problem of complex manufacturing process of module (m), simplifies the manufacturing process of module (m), and is used to determine the parameters of CT system.

【技术实现步骤摘要】
【国外来华专利技术】PCT国内申请,说明书已公开。

【技术保护点】
PCT国内申请,权利要求书已公开。/n

【技术特征摘要】
【国外来华专利技术】PCT国内申请,...

【专利技术属性】
技术研发人员:闫浩王雯李金升
申请(专利权)人:深圳市奥沃医学新技术发展有限公司
类型:发明
国别省市:广东;44

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